Guido Groeseneken: advisors and students

Academic Ancestry

a person in the record

Guido Groeseneken

Belgian professor of electrical engineering

Supervised 48 doctoral students between 2007 and 2025. Linked to Wikidata, ORCID, and 3 other registers.

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Students48

cited by a thesis record
Kateryna Serbulova “Latchup Exploration in Design-Technology and System-Technology Co-Optimization Scaling Era”
2025 · doctoral
cited by a thesis record
Wen-Chieh Chen “Solutions to General-purpose Input/Output Circuits and Electrostatic Discharge Protection in Advanced System-Design-Technology Co-optimization Scaling Options”
2024 · doctoral
cited by a thesis record
Michiel Vandemaele “Physics-Based Modeling of Hot-Carrier Degradation”
2023 · doctoral
cited by a thesis record
Roman Boschke “ESD Challenges for Advanced Technology and System Scaling - Germanium Finfet and Silicon Photonics”
2023 · doctoral
cited by a thesis record
Wei-Min Wu “RF ESD Exploration in Si/III-V Heterogeneous Integration for 5G/B5G Applications”
2022 · doctoral
cited by a thesis record
Zhicheng Wu “Development of Reliable Gate Stacks for Stacked MOS Devices in a 3D Sequential Integration”
2022 · doctoral
cited by a thesis record
Yang Xiang “Modelling, Exploration and Technology Assessment of Steep-subthreshold-slope Transistors for N5/N3 CMOS Power-performance Scaling”
2022 · doctoral
cited by a thesis record
Yueh Chang Wu “High Speed MRAM with Voltage Control of Magnetic Anisotropy (VCMA) Effect”
2021 · doctoral
cited by a thesis record
Jasper Bizindavyi “Modeling and Calibration of Device Non-Idealities in Steep-Slope Devices”
2021 · doctoral
cited by a thesis record
Kai Hsin Chuang “Highly Reliable Physically Unclonable Functions: Design, Characterization and Security Analysis”
2020 · doctoral
cited by a thesis record
Yashwanth Balaji “Heterojunction Tunnel FETS using 2D Materials as Channel”
2020 · doctoral
cited by a thesis record
Bart Vermeulen “The Giant VCMA Effect for Novel MRAM Applications”
2020 · doctoral
cited by a thesis record
Xiangdong Li “Reliability and Integration of GaN Power Devices and Circuits on GaN-on-SOI”
2020 · doctoral
cited by a thesis record
V. Putcha “Reliability Characterization of Gate-stacks for III-V Channel MOSFETs”
2019 · doctoral
cited by a thesis record
A. Contino “Modeling of Graphene for Interconnect Applications”
2019 · doctoral
cited by a thesis record
K. Florent “Evaluation of Alternative Vertical Transistors for 3D NAND Applications”
2019 · doctoral
cited by a thesis record
M. Mohammed “Quantum-mechanical modeling towards trap-assisted tunneling in semiconductor devices”
2018 · doctoral
cited by a thesis record
M. Simicic “Reliability-aware simulation and validation for analog/mixed-signal circuits in sub-32nm CMOS”
2018 · doctoral
cited by a thesis record
S. Van Beek “Reliability Characterization of STT-MRAM Magnetic Memory. The Impact of Self-Heating”
2018 · doctoral
cited by a thesis record
Devin Verreck “Quantum Mechanical Transport Towards the Optimization of Heterostructure Tunnel Field-effect Transistors”
2017 · doctoral
cited by a thesis record
Jan Doise “Implementation of Block Copolymer Based Directed Self-assembly for Advanced Lithography”
2017 · doctoral
cited by a thesis record
Chao-Yang Chen “Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory”
2017 · doctoral
cited by a thesis record
Ajay Sampath Bhoolokam “Characterization of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors”
2016 · doctoral
cited by a thesis record
Erik Bury “Assessing Bias-Temperature Instabilities and Self-Heating Effects in Advanced Semiconductor Nodes”
2016 · doctoral
cited by a thesis record
Jie Hu “Performance Optimization and Long Term Stability of Integrated GaN Diodes”
2016 · doctoral
cited by a thesis record
Manoj Nag “Study of Process Technology and Device Architecture for Amorphous Indium Gallium Zinc Oxide Thin Film Transistors”
2016 · doctoral
cited by a thesis record
Pieter Weckx “Coping with Time-dependent Variability by a Combined Design and Technology Co-optimization”
2016 · doctoral
cited by a thesis record
Chen Wu “In Depth Understanding of Low-k Dielectric Reliability in Interconnect Systems”
2016 · doctoral
cited by a thesis record
Tian-Li Wu “Long Term Stability of Enhancement Mode GaN Power Devices”
2016 · doctoral
cited by a thesis record
Yi Li “Metallic Nanopores for Single-molecule DNA Sensing”
2015 · doctoral
cited by a thesis record
Leqi Zhang “Study of the Selector Element for Resistive Memory”
2015 · doctoral
cited by a thesis record
Paulina Rincon Delgadillo “Origin of Defects in Directed Self-Assembly of Diblock Copolymers Using Feature Multiplication (Over het ontstaan van defecten bij patroon vermenigvuldiging door middel van Geleide Zelf-Assemblage van diblock copolymeren)”
2014 · doctoral
cited by a thesis record
Yangyin Chen “Electrical Characterization of Functional Oxides for Resistive RAM Memory Applications (Elektrische karakterisatie van functionele oxiden voor resistieve RAM applicaties)”
2013 · doctoral
cited by a thesis record
Jacopo Franco “Reliability of High Mobility (Si)Ge Channel pMOSFETs for Future CMOS Applications - Toward Reliable Ultra-thin EOT Nanoscale Transistors (Betrouwbaarheid van hoge mobiliteits-(Si)Ge kanaal pMOSFETs voor geavanceerde CMOS toepassingen - naar betrouwbare nm-schaal transistoren met ultradunne equivalente oxidedikte)”
2013 · doctoral
cited by a thesis record
Hari Pathangi Sriraman “Parallel Assembly of Carbon Nanotubes for NEMS Applications (Parallelle assemblage van koolstof nanobuizen voor NEMS applicaties)”
2013 · doctoral
cited by a thesis record
Daniele Leonelli “Design, Fabrication and Characterization of Tunnel Field Effect Transistors for Ultra-Low Power CMOS Applications (Ontwerp, fabricatie en karakterisatie van tunnel veld effect transistoren voor ultra-laag vermogen CMOS toepassingen)”
2012 · doctoral
cited by a thesis record
William Vandenberghe “Quantum Transport in Tunnel Field-Effect Transistors for Future Nano-CMOS Applications (Kwantumtransport in tunneling veld-effect-transistoren voor toekomstige nano-CMOS toepassingen)”
2012 · doctoral
cited by a thesis record
Nicolò Chiodarelli “Integration of Carbon Nanotubes as Future Interconnections for Sub-32 nm Technologies (Integratie van koolstof nanobuisjes als toekomstige interconnecties voor sub-32 nm technologie)”
2011 · doctoral
cited by a thesis record
Sandeep Sangameswaran “Electrostatic Discharge (ESD) in Microelectromechanical Systems (MEMS): Sensitivity and Protection (Elektrostatische ontlading (ESD) in micro-elektromechanische systemen (MEMS): gevoeligheid en bescherming)”
2011 · doctoral
cited by a thesis record
Claudia Santini “From Surface Plasmon Resonance Based Sensors to Carbon Nanotube Based Sensors (Van oppervlakte plasmon resonantie gebaseerde sensoren tot koolstof nanobuis gebaseerde sensoren)”
2011 · doctoral
cited by a thesis record
Sahar Sahhaf “Electrical Defects in High-k / Metal Gate MOS Transistors (Elektrische defecten in High-k / Metal Gate MOS transistoren)”
2010 · doctoral
cited by a thesis record
Koen Martens “Electrical Characterization and Modeling of Ge/III-V - Dielectric Interfaces (Elektrische karakterisering en modellering van germanium III-V diëlektricum grensvlakken)”
2009 · doctoral
cited by a thesis record
Marc Aoulaiche “Bias Temperature Instabilities in MOSFETs with High-k Dielectrics and Metal Gates (Instelpunt-Temperatuur-Instabiliteiten in MOSFETs met hoge-k diëlectrica en metaalpoortelektrodes)”
2009 · doctoral
cited by a thesis record
Steven Thijs “ESD Protection for Multiple Gate Field Effect Devices and for RF CMOS Circuits (ESD bescherming voor meervoudige gate veld effect structuren en voor RF CMOS circuits)”
2009 · doctoral
cited by a thesis record
Lionel Trojman “Charge Carrier Mobility for Advanced High-k/Metal Gate MOSFET in CMOS Technology: An Experimental Study Ladingdragersmobiliteit voor geavanceerde MOSFET's met hoge-k dielectrica en metaal gate technologie: een experimentele studie)”
2009 · doctoral
cited by a thesis record
Adelina Shickova “Bias Temperature Instability Effects in Devices with Fully-Silicided Gate Stacks, Strained-Si and Multiple-Gate Architectures (Instelpunt-temperatuurs-instabiliteits- en mechanische spanningseffecten in transistoren met volledig gesilicideerde en meervoudige poortarchitecturen)”
2008 · doctoral
cited by a thesis record
Thomas Kauerauf “Degradation and Breakdown of MOS Gate Stacks with High Permittivity Dielectrics (Degradatie en doorslag van MOS poortstructuren met hoge-permittiviteit-diëlectrica)”
2007 · doctoral
cited by a thesis record
Yunlong Li “Low-k dielectric reliability in copper interconnects”
2007 · doctoral

The line above and below

Below them, within 3 steps, the record reaches 56 people: 56 cited by thesis records.

Education and career3

From Wikidata, shown separately from the thesis records. Each place opens its Wikidata item.

1980 to 1986
Katholieke Universiteit Leuven
studied
from 1987
Interuniversity Microelectronics Centre
worked
from 2006
Katholieke Universiteit Leuven
worked